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Applications of atomic spectrometry to regulatory compliance monitoring / Stephen W. Jenniss, Sidney A. Katz and Richard W. Lynch.

By: Jenniss, Stephen W.
Contributor(s): Katz, Sidney A | Lynch, Richard W.
Material type: TextTextPublisher: New York : Wiley-VCH, ©1997Edition: 2nd ed.Description: xv, 248 pages : illustrations ; 25 cm.ISBN: 047119039x.Subject(s): Atomic absorption spectroscopyDDC classification: 628.52 JEN
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628.52 JEN (Browse shelf) 1 Available 3010004443

Includes index.

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