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Handbook of instrumentation and techniques for semiconductor nanostructure characterization / edited by Richard Haight, Frances M. Ross and James B. Hannon.
Contributor(s): Haight, Richard | Ross, Frances M | Hannon, James B.
Material type:
TextSeries: World Scientific series in materials and energy, v-2.Publisher: Hackensack, NJ : World Scientific, c2012Description: volumes : illustrations ; 24 cm.ISBN: 9789814322805 (set); 9814322806 (set); 9789814322812 (v. 1); 9789814322829 (v. 2).Subject(s): Nanostructured materials | NanotechnologyDDC classification: 620.115 HAN
Contents:
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| Item type | Current location | Call number | Copy number | Status | Date due | Barcode |
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UAP Central Library General Stacks | 620.115 HAN V-2 (Browse shelf) | 1 | Available | 3010021141 |
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| 620.1126 FRA V-2 Fractography of modern engineering materials : | 620.1126 FRA V-7 Fracture mechanics : | 620.1126 SMA Small-crack test methods / | 620.115 HAN V-2 Handbook of instrumentation and techniques for semiconductor nanostructure characterization / | 620.118 COM Composite applications : | 620.118 COM Composite materials : | 620.118 COM V-12 Composite Materials: |
Includes bibliographical references and index.
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