000 01033nam a22003017a 4500
999 _c7498
_d7498
001 21141
003 BD-DhUAP
005 20210123144336.0
008 210123s2012 si a f b 001 0 eng d
020 _a9789814322805 (set)
020 _a9814322806 (set)
020 _a9789814322812 (v. 1)
020 _a9789814322829 (v. 2)
040 _aMYPMP
_cMYPMP
_dBD-DhUAP
_bEng
082 0 4 _a620.115 HAN
_223
245 0 0 _aHandbook of instrumentation and techniques for semiconductor nanostructure characterization /
_cedited by Richard Haight, Frances M. Ross and James B. Hannon.
260 _aHackensack, NJ :
_bWorld Scientific,
_cc2012.
300 _avolumes :
_billustrations ;
_c24 cm.
490 _aWorld Scientific series in materials and energy, v-2.
504 _aIncludes bibliographical references and index.
505 _aV. 2--
650 0 _aNanostructured materials.
650 0 _aNanotechnology.
700 1 _aHaight, Richard.
700 1 _aRoss, Frances M.
700 1 _aHannon, James B.
942 _2ddc
_cBK