000 | 01033nam a22003017a 4500 | ||
---|---|---|---|
999 |
_c7498 _d7498 |
||
001 | 21141 | ||
003 | BD-DhUAP | ||
005 | 20210123144336.0 | ||
008 | 210123s2012 si a f b 001 0 eng d | ||
020 | _a9789814322805 (set) | ||
020 | _a9814322806 (set) | ||
020 | _a9789814322812 (v. 1) | ||
020 | _a9789814322829 (v. 2) | ||
040 |
_aMYPMP _cMYPMP _dBD-DhUAP _bEng |
||
082 | 0 | 4 |
_a620.115 HAN _223 |
245 | 0 | 0 |
_aHandbook of instrumentation and techniques for semiconductor nanostructure characterization / _cedited by Richard Haight, Frances M. Ross and James B. Hannon. |
260 |
_aHackensack, NJ : _bWorld Scientific, _cc2012. |
||
300 |
_avolumes : _billustrations ; _c24 cm. |
||
490 | _aWorld Scientific series in materials and energy, v-2. | ||
504 | _aIncludes bibliographical references and index. | ||
505 | _aV. 2-- | ||
650 | 0 | _aNanostructured materials. | |
650 | 0 | _aNanotechnology. | |
700 | 1 | _aHaight, Richard. | |
700 | 1 | _aRoss, Frances M. | |
700 | 1 | _aHannon, James B. | |
942 |
_2ddc _cBK |